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Equipment at JASMiN
ISE-OE-PVD-3000 DC and RF Magnetron Sputtering System
- Used for deposition of metal, oxide and nitride thin film materials.
- Wafer size: 2 or 3 inches
- Target size: 2 inches
Cressington 108 auto sputter-coater
- Used for routine sample preparation for scanning electron microscopy.
- Target: gold
Karl Suss RC8 Spinner
- Used for spin-on coating of photoresist materials and polymeric materials.
- Distributes materials evenly across the surface of a substrate by spinning the substrate.
- Wafer size: Up to 6 inches
Karl Suss MA 6 Double-side Mask Aligner
- UV Mask aligner with double-sided capability used for
photolithographically defining photoresist patterns onto substrates.
- Wafer size: 6 inches
Chemical Wet Bench
- Used for general chemical processing, such as wet chemical etching
Veeco Dektak3 ST Surface Profile Measurement System
- Used to measure surface profile (sub micron) and film thickness (up to 262µm) after microfabrication steps.
- Permits scans as long as 50mm with a maximum of 8,000 data points to determine accurate step heights and surface roughness.
HYBOND Model 572A-40 Wedge Bonder
- Used for making wire connections onto finished devices.
Nikon Eclipse L150 Microscope
- Used for optical characterization or observation of samples.
- Capabilities: 5x, 20x, 50x, 100x extra long working distance Plan objectives; 6x6" XY stage; Brightfield, darkfield, differential interference, polarization illumination; Spot Insight color camera (1600x1200) image capture, feature measurement, documentation.
Micro Automation 1100 Wafer Dicing Saw
- Microprocessor-controlled, programmable, automatic saw for cutting semiconductor wafers and other hard materials.
- Closed circuit TV system with split image optics to align the wafers before cutting.
- Wafer size: 6 inches
Agilent 4284 A Precision LCR Meter
- Used for measurement of electrical properties.
- Range: 20 Hz to 1 MHz with over with 8610 selectable test frequencies.
Karl Suss PM5 Analytical Probe System
- Allows electrical probing of device under test.
- Capabilities: Applying signals to individual die or wafers up to 8" diameter.
- Currently used in conjunction with ETEC MMA.
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